For very large and dense components requiring precise dimensional metrology and quality control, our group offers advanced solutions with a unique 450 kV system in Belgium. Applications include crack detection, large-scale dimensional metrology, CAD comparison, assembly inspection, and recently XCT for structural analysis and component differentiation to aid de-manufacturing and recycling.
Technical Details
X-Ray tube
Detector 1
Detector 2
Manipulator
CT-Capabilities
X-Ray tube
X-Ray tube: Reflection target X-Ray Source
Operation modes | Open tube, microfocus |
Targets | Tungsten reflection target |
Voltage | 80-450 kV |
Power | 450 W |
Min focal spot size | 80 µm up to 50 W |
Detector 1
Detector 1: 3D Perkin Elmer 1620 Flat Panel Detector
Grey scale resolution | 16 bit |
Pixels | 2000×2000 (4 megapixels) |
Pitch | 200 µm |
Field of view | 285×285 mm2 without stacking |
Frame rate | Up to 7.5 fps |
Source detector distance | 1027.65 mm |
Magnification | 1.4x to 15x |
Detector 2
Detector 2: 2D Curved Linear Diode Array (CLDA)
Grey scale resolution | 16 bit |
Pixels | 2000 |
Pitch | 415 µm |
Frame rate | 50 fps |
Source detector distance | 1027.65 mm |
Magnification | > 8x |
Manipulator
Manipulator:
Axis | X = 400 mm Y = 600 mm Z = 600 mm Rotation = 360° |
Focus detector distance | SDD = 1027.65 mm |
Max sample weight | 50 kg |
CT-Capabilities
Reconstruction workstation | Xeon E5-2650 v2 128GB RAM > 100 TB (NAS System) Nvidia 3070 Ti |
Room: Celestijnenlaan 300, 3001 Leuven, Mechanical Engineering, XCT lab 00.192
More Technical information: mirko.sinico@kuleuven.be; wim.dewulf@kuleuven.be