GE Nanotom S

The Nanotom S with its high-power nanofocus tube and stabilised ultra-precision mechanics invades the sub-micron range in voxel size. The Nanotom S was the first 180 kV / 15 W nanofocus computed tomography system. The Nanotom S is the inspection solution for a wide range of 3D CT applications. Once scanned, the fully three dimensional CT information allows many possibilities for analysis, e.g. non-destructive visualization of slices, arbitrary sectional views, or automatic pore analysis. Since the whole geometry of the object is scanned, precise 3D measurements of complex objects are possible.

Technical Details

Room: Kasteelpark Arenberg 44, 3001 Leuven, Materials Engineering, X-ray lab: 91.15

More Technical information: johan.vanhulst@kuleuven.be; jeroen.soete@kuleuven.be